titleWhen More Sampling Hurts: The Modal Ceiling and Correlation Ceiling of Test-Time Scaling
authorsYong Yi Bay, Kathleen A. Yearick
date2026-06-27
venuearXiv (preprint, not peer reviewed)
idarXiv:2606.28661
upvotes4 (Hugging Face Daily Papers, 2026-11-01)
linksabs pdf hf code
abstractPeople overthink; language models over-sample, and the extra effort can talk both into a worse answer. Reasoning systems answer a hard question by sampling it many times (test-time scaling), and the more they draw, the more often a correct answer turns up somewhere, so coverage, the fraction of problems with at least one correct try, climbs and appears to be progress. But a deployed system must return one answer, and choosing it, not knowing which try is right, is selection; selection is capped, and past a point extra samples only make the model surer of a confident mistake, even as every draw adds cost. The gap between climbing coverage and stalled selection, the identifiability gap, is the answer a model can produce but not pick. So the real question is not whether to sample but how far, and the answer is: not far. For picking an answer, the vote has already settled within a few dozen draws, the modal ceiling; for scoring a benchmark, sooner still, the correlation ceiling. Beyond that, extra draws cost compute and add nothing, and can even make the answer worse. This paper turns the cutoff into a single number, the effective number of samples, that any sampling run already reveals. The bottleneck is recognizing a right answer, not generating one.

cite

@misc{bay2026when,
  title={When More Sampling Hurts: The Modal Ceiling and Correlation Ceiling of Test-Time Scaling},
  author={Yong Yi Bay and Kathleen A. Yearick},
  year={2026},
  eprint={2606.28661},
  archivePrefix={arXiv},
  url={https://arxiv.org/abs/2606.28661}
}